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JEOL Ltd. (President Gon-emon Kurihara) announces the release of the JIB-4700F Multi Beam System, a newly-developed FIB-SEM instrument to be distributed in March 2017.

Main Features 

  1. 3D Observation/Analysis

  2. High-resolution SEM observation

  3. Fast EDS, EBSD, analysis (High probe current with High resolution)

  4. High-speed processing (High probe current)

  5. Simultaneous detection system

  6. TEM preparation lamella

  7. Picture overlay system