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Nel numero di JEOL NEWS di Settembre 2014 tra le notizie principali la presentazione di due nuovi strumenti dalle prestazioni tecniche senza eguali: lo spettrometro NMR JEOL serie Z ed il nuovo TEM GRAND ARM dalla risoluzione in STEM migliore al mondo.

Ecco in dettaglio gli articoli presenti nel Volume 49 di JEOL NEWS:

  • Development of Aberration Corrected Differential Phase Contrast (DPC) STEM
  • Atomic-Resolution Characterization Using the Aberration-Corrected JEOL JEM-ARM200CF at the University of Illinois – Chicago
  • Quantitative Characterization of Magnetic Materials Based on Electron Magnetic Circular Dichroism with Nanometric Resolution Using the JEM-1000K RS Ultra-High Voltage STEM
  • Photonic Crystal Lasers
  • Electron Microprobe Study of the Yinxu (Anyang) Bronze of Academia Sinica Collection
  • Elucidation of Deterioration Mechanism for Organic Solar Cells – Toward Highly Efficient Solar Cells
  • Super High Resolution Imaging with Atomic Resolution Electron Microscope of JEM-ARM300F
  • Advanced Analysis of Active Materials in Li-Ion Battery by XPS and AES
  • Characteristic Features and Applications of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe X-ray Microanalyzers and Scanning Electron Microscopes
  • Analysis of Organic Thin Films by the Laser Desorption/Ionization Method Using the JMS-S3000 “SpiralTOF”
  • Ultra-Low-Temperature-Probes (UltraCOOL™ probe / SuperCOOL™ probe)
  • New Series of NMR Spectrometers JNM-ECZ

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