Ispezione di Wafer per SEM

Strumenti per semi-conduttori

Strumenti di analisi di maschere per
migliorare la gestione delle prestazioni,
consente di rilevare rapidamente le imperfezioni
e i difetti inaccettabili.

WM-7 Wafer Surface Inspector
The world’s first Violet-LD wafer surface analyzer, the WM-7 offers high performance at a low investment price and low operating cost. The WM-7 Features high accuracy, real-time particle counting for wafers ranging from 50mm to 200mm in diameter.


  • Violet Laser Diode
  • Wafer sizes ranging from 50 mm to
  • 200mm
  • High performance and small footprint
  • Particle information with higher accuracy provided via realtime
  • counting process
  • A variety of options:
    • automatic detectivity adjustment
    • edge chuck
    • communication with host
JEOL USA is pleased to represent Topcon semiconductor equipment with North American sales and award-winning service support.